test_definitions.xml

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    =======================================================================
    Filename: test_definitions.xml
    Author: Alexander Graening
    Affiliation: University of California, Los Angeles
    Email: agraening@ucla.edu

    Test Process Definition Format:
        - Name: The name listed here is the name that should be referenced in the system definition.
        - Test Self: This is a boolean value that determines if the chip is individually tested.
            Note that self_ parameters all relate to this individual dest of the chip.
        - Test Assembly: This is a boolean value that determines if the assembly consisting of the 
            chip and chips stacked on it is tested before integration with the rest of the design.
            Note that assembly_ parameters all relate to this test of the assembly.
        - Black Box Pattern Count: This is a black box parameter that overrides the computed
            pattern count.
        - Black Box Scan Chain Length: This is a black box parameter that overrides the computed
            scan chain length.
        - Defect Coverage: This is the defect coverage of the test. This is a number between 0.0
            and 1.0. (TODO: This would be nice to include as a computed parameter.)
        - Time Per Test Cycle: This is the time required for a single cycle of test. Note that a single 
            pattern with a scan chain length of 16 would have a time cost os 16x this value.
        - Cost Per Second: This is the cost per second for testing. This is based on the time 
            spend on the test machine and the test machine cost.
        - Test Reuse: This is the number of times a test can be reused. For example if there are 
            many analogous structures in a design, it is possible to pass in the test pattern once 
            and simultaneously test all instances.
            not used.)
        - Gate Flop Ratio: This is the ratio of gates to flops in the design. This is used to 
            determine the number of scan chains required for testing. Note that this also requires
            the number of gates per unit area defined in the layer definition.
        - Number of Scan Chains: This is the number of scan chains in the chip. This reduces 
            the scan chain length and speeds up testing.
        - Number of IO per Scan Chain: This is the number of IOs per scan chain. This reduces 
            assumes total number of IOs follows ax+b where x is the number of scan chains and
            this parameter is a.
        - Number of Test IO Offset: This is the number of IOs that are part of testing, but 
            do not scale with the number of scan chains. This is the b in the ax+b equation.

    Description: Example test process for a chip that can be used as a template for other test
            process definitions. The test process is defined for each chip and contains parameters
            for testing itself and for testing the assembly consisting of the chip and all chips
            stacked on it. Note that instead of modifying this test process, users should add
            additional processes and treat this file as a library of test processes.

    Note that each parameter is required to be set even if it is not relevant to the application.
            If is it not used, select a relevant value that will interact correctly with the cost model.
            If no value is selected, at least define the line as the empty string: <parameter_name="">.
            A list of required parameters for the test_process object is below:
                - name
                - time_per_test_cycle
                - cost_per_second

                - test_self
                - bb_self_pattern_count
                - bb_self_scan_chain_length
                - self_defect_coverage
                - self_test_reuse
                - self_gate_flop_ratio
                - self_num_scan_chains
                - self_num_io_per_scan_chain
                - self_num_test_io_offset
                - self_test_failure_dist (normal, uniform, exponential, or lognormal)

                - test_assembly
                - bb_assembly_pattern_count
                - bb_assembly_scan_chain_length
                - assembly_defect_coverage
                - assembly_test_reuse
                - assembly_gate_flop_ratio
                - assembly_num_scan_chains
                - assembly_num_io_per_scan_chain
                - assembly_num_test_io_offset
                - assembly_test_failure_dist (normal, uniform, exponential, or lognormal)
-->


<!-- Note on parameters. All test process parameters are arbitrary and set to test different things. -->
<test_processes>
    <test_process name="test_process_0"
        time_per_test_cycle="0.000000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count=""
        bb_self_scan_chain_length=""
        self_defect_coverage="0.9" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="0"
        bb_assembly_scan_chain_length="0"
        assembly_defect_coverage="0.9"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="notest"
        time_per_test_cycle="0.1"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="False"
        bb_self_pattern_count=""
        bb_self_scan_chain_length=""
        self_defect_coverage="0" 

        self_test_reuse="1"
        self_num_scan_chains="0"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="False"
        bb_assembly_pattern_count="0"
        bb_assembly_scan_chain_length="0"
        assembly_defect_coverage="0"

        assembly_test_reuse="1"
        assembly_num_scan_chains="0"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <!-- Known Good Dies (KGD) means the dies used in an assembly are known to be good. -->
    <!-- This does not mean yield is 100% for the full system since there is still yield associated with assembly. -->
    <test_process name="KGD_free_test"
        time_per_test_cycle="0.1"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="0"
        bb_self_scan_chain_length="0"
        self_defect_coverage="1.0" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="0"
        bb_assembly_scan_chain_length="0"
        assembly_defect_coverage="1.0"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="KGD_interposer_free_test"
        time_per_test_cycle="0.1"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="0"
        bb_self_scan_chain_length="0"
        self_defect_coverage="1.0" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="0"
        bb_assembly_scan_chain_length="0"
        assembly_defect_coverage="1.0"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_1.0"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="1000"
        bb_self_scan_chain_length="100000"
        self_defect_coverage="1.0" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="8"
        bb_assembly_scan_chain_length="100"
        assembly_defect_coverage="1.0"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_0.999"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="0"
        bb_self_scan_chain_length="0"
        self_defect_coverage="0.999" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="0"
        bb_assembly_scan_chain_length="0"
        assembly_defect_coverage="0.999"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <!--
    <test_process name="free_test_0.99"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="0"
        bb_self_scan_chain_length="0"
        self_defect_coverage="0.99" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="0"
        bb_assembly_scan_chain_length="0"
        assembly_defect_coverage="0.99"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    -->
    <test_process name="free_test_0.95"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="200"
        bb_self_scan_chain_length="100000"
        self_defect_coverage="0.95" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="4"
        bb_assembly_scan_chain_length="100"
        assembly_defect_coverage="0.95"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_0.9"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="100"
        bb_self_scan_chain_length="100000"
        self_defect_coverage="0.9" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="2"
        bb_assembly_scan_chain_length="100"
        assembly_defect_coverage="0.9"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_0.99"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="640"
        bb_self_scan_chain_length="500000"
        self_defect_coverage="0.99" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="64"
        bb_assembly_scan_chain_length="500"
        assembly_defect_coverage="0.99"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_0.98"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="320"
        bb_self_scan_chain_length="500000"
        self_defect_coverage="0.98" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="32"
        bb_assembly_scan_chain_length="500"
        assembly_defect_coverage="0.98"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_0.96"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="160"
        bb_self_scan_chain_length="500000"
        self_defect_coverage="0.96" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="16"
        bb_assembly_scan_chain_length="500"
        assembly_defect_coverage="0.96"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_0.92"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="80"
        bb_self_scan_chain_length="500000"
        self_defect_coverage="0.92" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="8"
        bb_assembly_scan_chain_length="500"
        assembly_defect_coverage="0.92"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_0.84"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="40"
        bb_self_scan_chain_length="500000"
        self_defect_coverage="0.84" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="4"
        bb_assembly_scan_chain_length="500"
        assembly_defect_coverage="0.84"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_0.68"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="20"
        bb_self_scan_chain_length="500000"
        self_defect_coverage="0.68" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="2"
        bb_assembly_scan_chain_length="500"
        assembly_defect_coverage="0.68"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_0.36"
        time_per_test_cycle="0.0000001"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="10"
        bb_self_scan_chain_length="500000"
        self_defect_coverage="0.5" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="1"
        bb_assembly_scan_chain_length="500"
        assembly_defect_coverage="0.5"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="free_test_0.1"
        time_per_test_cycle="0.1"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count="0"
        bb_self_scan_chain_length="0"
        self_defect_coverage="0.1" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="True"
        bb_assembly_pattern_count="0"
        bb_assembly_scan_chain_length="0"
        assembly_defect_coverage="0.1"

        assembly_test_reuse="1"
        assembly_num_scan_chains="1"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
    <test_process name="self_test_only_KGD_free_test"
        time_per_test_cycle="0.1"
        samples_per_input="1"

        cost_per_second="0.006"

        test_self="True"
        bb_self_pattern_count=""
        bb_self_scan_chain_length=""
        self_defect_coverage="1.0" 

        self_test_reuse="1"
        self_num_scan_chains="1"
        self_num_io_per_scan_chain="2"
        self_num_test_io_offset="1"

        self_test_failure_dist="normal"

        test_assembly="False"
        bb_assembly_pattern_count="0"
        bb_assembly_scan_chain_length="0"
        assembly_defect_coverage="0.0"

        assembly_test_reuse="1"
        assembly_num_scan_chains="0"
        assembly_num_io_per_scan_chain="2"
        assembly_num_test_io_offset="1"
        
        assembly_test_failure_dist="normal">
    </test_process>
</test_processes>